Anneal technique to recover the electrical characteristics of the packaged bipolar junction transistors damaged by Co-60 radiation
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Published:1994-05
Issue:3
Volume:12
Page:1377
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ISSN:0734-211X
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Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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language:
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Short-container-title:J. Vac. Sci. Technol. B
Author:
Chang-Liao Kuei-Shu
Publisher
American Vacuum Society
Subject
General Engineering