Summary Abstract: Characterization of rf‐sputtered CuInSe2 films-Reference-Cited by-同舟云学术

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Summary Abstract: Characterization of rf‐sputtered CuInSe2 films

Published:1983-04 Issue:2 Volume:1 Page:510-511
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Krishnaswamy S. V.,Manocha A. S.,Szedon J. R.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.571919

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Heterogeneous reaction route to CuInS2 thin films;Chemical Communications;2002-05-30

2. Solid-state and solution phase metathetical synthesis of copper indium chalcogenides;Journal of Materials Chemistry;1998

3. Oxygen interaction with ternary chalcogenide: an electron spectroscopy for chemical analysis study of AgInTe2;Journal of Materials Research;1995-05

4. Growth and characterization of CuInSe2 thin films;Journal of Materials Science;1993

5. Preparation of copper-indium sulfide thin films by single-source OMCVD: Mass-spectral investigation of decomposition path of the organometallic sources;Applied Organometallic Chemistry;1992-12

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