Long term field emission current stability characterization of planar field emitter devices-Reference-Cited by-同舟云学术

Long term field emission current stability characterization of planar field emitter devices

Published:2021-09 Issue:5 Volume:39 Page:053201
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B
language:en
Short-container-title:Journal of Vacuum Science & Technology B

Author:

Bhattacharya Ranajoy¹^ORCID,Turchetti Marco²^ORCID,Keathley P. Donald²^ORCID,Berggren Karl K.²^ORCID,Browning Jim¹^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, Boise State University, 1375 W University Dr., Boise, Idaho 83725

2. Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, Massachusetts 02139

Funder

Air Force Office of Scientific Research

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

https://avs.scitation.org/doi/pdf/10.1116/6.0001182

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