Secondary-ion mass analysis: Instrumentation, data interpretation, and applications
-
Published:1974-11
Issue:6
Volume:11
Page:1093-1099
-
ISSN:0022-5355
-
Container-title:Journal of Vacuum Science and Technology
-
language:en
-
Short-container-title:Journal of Vacuum Science and Technology
Author:
Phillips Bradway F.
Publisher
American Vacuum Society
Subject
General Engineering
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Absolute cross section for forward recoiling hydrogen with 1.0–12.5 MeV 4He;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-11
2. Experimental Methods;The Chemical Physics of Surfaces;1977
3. Successful operation of a scanning ion microscope with quadrupole mass filter;Review of Scientific Instruments;1976
4. A New Scanning Ion Microscope for Surface and In-Depth Analysis;Ion Beam Surface Layer Analysis;1976
5. Ion probe microanalysis;Journal of Physics E: Scientific Instruments;1975-10