Assessing stability of metal tellurides as alternative photomask materials for extreme ultraviolet lithography
Author:
Affiliation:
1. IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
2. COCOON, Department of Solid State Sciences, Universiteit Gent, Zwijnaardsesteenweg 294, B-9000 Gent, Belgium
3. Physikalisch-Technische Bundesanstalt (PTB), Abbestraße 2-12, 10587 Berlin, Germany
Funder
ECSEL JU
Publisher
American Vacuum Society
Subject
Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials
Link
http://avs.scitation.org/doi/pdf/10.1116/1.5125662
Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Best focus alignment through pitch strategies for hyper-NA EUV lithography;Optical and EUV Nanolithography XXXVII;2024-04-10
2. Nonsymmorphic symmetry protected nodal lines in layered topological semimetal Ta3GeTe6;Applied Physics Letters;2024-04-08
3. Identifying new absorber materials for EUV photomasks;Photomask Technology 2023;2023-11-21
4. Exploring photomask etching capabilities for new extreme ultraviolet absorber materials;Photomask Japan 2023: XXIX Symposium on Photomask and Next-Generation Lithography Mask Technology;2023-09-29
5. Evaluation of Ta-Co alloys as novel high-k extreme ultraviolet mask absorber;Journal of Micro/Nanopatterning, Materials, and Metrology;2023-06-21
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3