Author:
Ohta Susumu,Yoshimura Nagamitsu,Hirano Haruo
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by
26 articles.
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1. Methods for measuring outgassing rates;Foundations of Molecular-Flow Networks for Vacuum System Analysis;2020
2. Physical basis of molecular-flow networks: adsorption, desorption, diffusion, and outgassing/pumping;Foundations of Molecular-Flow Networks for Vacuum System Analysis;2020
3. Applications of the resistor-network simulation method to complicated ultrahigh vacuum systems;Foundations of Molecular-Flow Networks for Vacuum System Analysis;2020
4. Adsorption, desorption, diffusion, and outgassing/pumping;A Review: Ultrahigh-Vacuum Technology for Electron Microscopes;2020
5. Cascade diffusion pump systems for electron microscopes;A Review: Ultrahigh-Vacuum Technology for Electron Microscopes;2020