Critical evaluation of band bending determination in organic films from photoemission measurements-Reference-Cited by-同舟云学术

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Critical evaluation of band bending determination in organic films from photoemission measurements

Published:2009-09 Issue:5 Volume:27 Page:1178-1182
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Ivanco J.,Zahn D. R. T.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.3196814

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Modification of C60 nano-interlayers on organic field-effect transistors based on 2,7-diocty[1]benzothieno-[3,2-b]benzothiophene (C8-BTBT)/SiO2;Results in Physics;2020-12

2. A marked change in electrical resistivity of alumina upon exposure to trace concentration of acetone vapours;Ceramics International;2020-07

3. Damaging Effect of Hot Metal Atoms on Organic Semiconducting Films during Top Contact Formation;The Journal of Physical Chemistry C;2015-02-16

4. Modified transmission-line method for evaluation of the contact resistance: Effect of channel-length-dependent threshold voltage;Japanese Journal of Applied Physics;2013-12-30

5. PRACTICAL PHOTOEMISSION CHARACTERIZATION OF MOLECULAR FILMS AND RELATED INTERFACES;ACTA PHYS SLOVACA;2013

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