Investigation of the dielectric recovery process of vacuum arc in double breaks by planar laser-induced fluorescence

Author:

Wang Zhenxing1ORCID,Cao Bo1ORCID,Li Rui1ORCID,Sun Liqiong1,Li Haomin1,Geng Yingsan1ORCID,Wang Jianhua1

Affiliation:

1. State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University , Xi’an 710049, China

Abstract

The multibreak vacuum circuit breaker uses multiple short gaps to interrupt the fault current, greatly improving the dielectric strength, and is a viable method to realize high-voltage interruption. The metal vapor distribution near the current zero is crucial for the dielectric recovery process in the multibreak vacuum circuit breaker. Due to the complicated dielectric construction and the interaction between the breakers, the vacuum arc inevitably deviates from the axisymmetric distribution during the interruption process. The traditional diagnosis method limited to 0D or 1D is not sufficient to study the real distribution of metal vapor near the current zero. To address these issues, we developed a planar laser-induced fluorescence method to measure the 2D distribution of copper vapor near the current zero by detecting 510.6 nm fluorescence intensity. The results indicate that for the butt contacts, the copper vapor is diffused in the gap of the high-voltage break and aggregated on the cathode surface of the low-voltage break. The axial magnetic field and transverse magnetic field affect the 2D copper vapor distribution and eliminate the inconsistency, which is achieved by affecting the motion of charged particles and the ionization-recombination process. Furthermore, the copper vapor density exhibits a positive dependence on the arc current, and the magnetic field impacts the density increase rate and distribution mode.

Funder

National Key Research and Development Program of China

National Natural Science Foundation of China

State Key Lab Laser Interact Matter

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

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