Defect structure of epitaxial ZnO films on (0001) sapphire studied by transmission electron microscopy-Reference-Cited by-同舟云学术

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Defect structure of epitaxial ZnO films on (0001) sapphire studied by transmission electron microscopy

Published:2001 Issue:2 Volume:19 Page:506
ISSN:0734-211X
Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
language:en
Short-container-title:J. Vac. Sci. Technol. B

Author:

Lim S.-H.,Shindo D.,Kang H.-B.,Nakamura K.

Publisher

American Vacuum Society

Subject

General Engineering

Cited by 27 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Defect analysis by transmission electron microscopy of epitaxial Al-doped ZnO films grown on (0001) ZnO and a-sapphire by RF magnetron sputtering;Journal of Applied Physics;2016-07-07

2. Minority Carrier Transport in ZnO and Related Materials;Springer Series in Materials Science;2011-11-24

3. STRUCTURAL INVESTIGATION OF n-ZnO/p-GaN ULTRAVIOLET LIGHT-EMITTING DIODES GROWN BY ATOMIC LAYER DEPOSITION;Functional Materials Letters;2011-09

4. Structural and Photoluminescence Properties of ZnO Films Grown on 6H-SiC Substrates by Low-Temperature Atomic Layer Deposition;Journal of The Electrochemical Society;2011

5. Structure and stimulated emission of a high-quality zinc oxide epilayer grown by atomic layer deposition on the sapphire substrate;Thin Solid Films;2010-10

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