X-ray analysis of metamorphic InxGa1-xAs/InyGa1-yAs superlattices on GaAs (001) substrates

Author:

Althowibi Fahad A.1,Ayers John E.1

Affiliation:

1. Electrical and Computer Engineering Department, University of Connecticut, Storrs, Connecticut 06269-4157

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. X-ray analysis for micro-structure of AlN/GaN multiple quantum well systems;Journal of Materials Science: Materials in Electronics;2018-10-31

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