Dual ion beam grown silicon carbide thin films: Variation of refractive index and bandgap with film thickness-Reference-Cited by-同舟云学术

Dual ion beam grown silicon carbide thin films: Variation of refractive index and bandgap with film thickness

Published:2019-07 Issue:4 Volume:37 Page:041802
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B
language:en
Short-container-title:Journal of Vacuum Science & Technology B

Author:

Mathur Aakash¹,Pal Dipayan¹,Singh Ajaib¹,Singh Rinki²,Zollner Stefan³⁴^ORCID,Chattopadhyay Sudeshna¹²⁵

Affiliation:

1. Discipline of Metallurgy Engineering and Materials Science, Indian Institute of Technology Indore, Indore 453552, India

2. Discipline of Biosciences and Biomedical Engineering, Indian Institute of Technology Indore, Indore 453552, India

3. Department of Physics, New Mexico State University, Las Cruces, New Mexico 88003

4. Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic

5. Discipline of Physics, Indian Institute of Technology Indore, Indore 453552, India

Funder

Council of Scientific and Industrial Research

Department of Science and Technology

National Science Foundation

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://avs.scitation.org/doi/am-pdf/10.1116/1.5097628

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