Microwave modulated photoluminescence as a contactless probe of interface states
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Published:1997-07
Issue:4
Volume:15
Page:1201
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ISSN:0734-211X
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Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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language:
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Short-container-title:J. Vac. Sci. Technol. B
Publisher
American Vacuum Society
Subject
General Engineering
Cited by
2 articles.
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1. SURFACE AND INTERFACIAL RECOMBINATION IN SEMICONDUCTORS;Handbook of Surfaces and Interfaces of Materials;2001
2. Microwave modulated photoluminescence used to measure surface recombination velocities;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1998-07