Measurement of ion energy distribution in an orbitron device
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Published:1981-04
Issue:3
Volume:18
Page:987-993
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ISSN:0022-5355
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Container-title:Journal of Vacuum Science and Technology
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language:en
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Short-container-title:Journal of Vacuum Science and Technology
Author:
Feidt M. L.,Petit B.
Publisher
American Vacuum Society
Subject
General Engineering
Cited by
9 articles.
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1. Electron motion and confinement in the orbitip vacuum gauge;Ultramicroscopy;1999-09
2. Ionising characteristics of an orbitron-type pump;Journal of Physics E: Scientific Instruments;1989-07
3. Ultrahigh vacuum pressure measurements: Limiting processes;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1987-09
4. Total pressure gauges;Vacuum;1987-01
5. Gauges for Low-Pressure Measurement;Total Pressure Measurements in Vacuum Technology;1985