An investigation of the chemistry of the dielectric/FeCoTb interface by x‐ray photoelectron spectroscopy and Auger electron spectroscopy
Author:
Publisher
American Vacuum Society
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Link
http://avs.scitation.org/doi/pdf/10.1116/1.574815
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3. Characterization of Tb at the interface of SiN/TbFeCo film by Auger electron spectroscopy;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1993-05
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