Oxidation of thin WSi2 overlayers on Si(111)-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Oxidation of thin WSi2 overlayers on Si(111)

Published:1987-07 Issue:4 Volume:5 Page:1412-1416
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Nguyen Tan T. A.,Azizan M.,Derrien J.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.574608

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Pressure effects on structural, electronic, elastic and lattice dynamical properties of XSi2 (X = Cr, Mo, W) from first principles;International Journal of Modern Physics B;2018-04-13

2. Effects of biaxial strains on electronic and elastic properties of hexagonal XSi2 (X = Cr, Mo, W) from first-principles;Solid State Communications;2018-02

3. Interaction of oxygen with (Er + Si): formation of erbium pyrosilicate Er2Si2O7;Applied Surface Science;1997-02

4. Oxidation of thin erbium and erbium silicide overlayers in contact with silicon oxide films thermally grown on silicon;Applied Surface Science;1996-08

5. Si LVV Auger lineshape analysis to study the oxygen chemisorption on TaSi2 thin film;Surface and Interface Analysis;1993-09

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP