Atomic force microscopy and x-ray diffraction studies on agglomeration phenomena of ultrathin Au/Fe bilayers-Reference-Cited by-同舟云学术

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Atomic force microscopy and x-ray diffraction studies on agglomeration phenomena of ultrathin Au/Fe bilayers

Published:2012-05 Issue:3 Volume:30 Page:031512
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Kamiko Masao,Koo Jung-Woo,Kim Jae-Min,Ha Jae-Geun

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.4705518

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effects of various seed layers on the agglomeration phenomenon on a MgO substrate;Solid State Communications;2022-09

2. Fabrication and Comparison of Self-Organized Ag and Au Nanodots on Ti/MgO(001) Substrates;Journal of Nanoscience and Nanotechnology;2020-05-01

3. Novel fabrication method of self-organized FePd multilayer nanodots using the agglomeration of Au/Fe bilayer films;Japanese Journal of Applied Physics;2017-06-15

4. Effect of seed layers on structure of self-organized Ag nanodots on MgO substrates;Japanese Journal of Applied Physics;2015-05-21

5. Fabrication of self-organized epitaxial fcc-Ag(110)-oriented nanorods by a Ti seed-layer-assisted thermal agglomeration method;Applied Physics Express;2015-02-17

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