Subject
Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials
Cited by
9 articles.
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1. Polarimetric calibration method for the fore-optics of a channeled spectropolarimeter;Optics Express;2023-11-20
2. Polarization aberration in-situ measurement in lithography tools;10th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced and Extreme Micro-Nano Manufacturing Technologies;2021-12-13
3. Hybrid calibration method of a wide-view-angle Mueller polarimeter for hyper-numerical-aperture imaging systems;Chinese Optics Letters;2020
4. Quantitative analysis of wide field-of-view and broadband quarter-wave plate based on metasurface;2017 International Conference on Optical Instruments and Technology: Micro/Nano Photonics: Materials and Devices;2018-01-12
5. Precise measurement and accuracy analysis for determining the fast or slow axis of wave plate;2017 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments;2018-01-10