A study of oxidized Nb–Al alloys using Auger electron spectroscopy and photoemission spectroscopy

Author:

Oshima Masaharu,Pate Bradford B.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Characteristics and growth processes of a surface oxidized layer formed on Al-Y alloy films;Electronics and Communications in Japan (Part II: Electronics);1996

2. Effects of underlayer roughness on Nb/AlO/sub x//Nb junction characteristics;IEEE Transactions on Applied Superconductivity;1993-03

3. Bonding mechanism between aluminum nitride substrate and Ag-Cu-Ti solder;IEEE Transactions on Components, Hybrids, and Manufacturing Technology;1992-06

4. Characterizations and growth mechanisms of the surface-oxidized layer formed on Al-Nb-(N) alloy films;Electronics and Communications in Japan (Part II: Electronics);1992

5. Reactions at the aluminum oxide-ferrite interface;Thin Solid Films;1990-12

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