Author:
Tsujino S.,Paraliev M.,Kirk E.,Vogel T.,Le Pimpec F.,Gough C.,Ivkovic S.,Braun H.-H.
Subject
Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials
Cited by
11 articles.
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1. On the brightness, transverse emittance, and transverse coherence of field emission beam;Journal of Vacuum Science & Technology B;2022-05
2. Measurement of transverse emittance and coherence of double-gate field emitter array cathodes;Nature Communications;2016-12-23
3. Electron beam collimation from an all-metal double-gate 40 000 nanotip array: Improved emission current and beam uniformity upon neon gas conditioning;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2015-05
4. Field emission beam characteristics of single metal nanotip cathodes with on-chip collimation gate electrode;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2015-05
5. Picosecond electrical switching of single-gate metal nanotip arrays;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2014-03