Electrical transport properties of ultrathin metallic films-Reference-Cited by-同舟云学术

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Electrical transport properties of ultrathin metallic films

Published:2005 Issue:4 Volume:23 Page:1412
ISSN:0734-211X
Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
language:en
Short-container-title:J. Vac. Sci. Technol. B

Author:

Tay Maureen,Li Kebin,Wu Yihong

Publisher

American Vacuum Society

Subject

General Engineering

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Surface sulfurization of liner and ruthenium metallization to reduce interface scattering for Low-Resistance interconnect;Applied Surface Science;2024-04

2. Grain-boundary/interface structures and scatterings of ruthenium and molybdenum metallization for low-resistance interconnects;Applied Surface Science;2023-08

3. Metal-to-Semimetal Transition in Platinum Nanotubes: Dependence on Thickness;The Journal of Physical Chemistry Letters;2021-02-25

4. Anomalous Hall magnetoresistance in a ferromagnet;Nature Communications;2018-06-08

5. Resistivity scaling model for metals with conduction band anisotropy;Physical Review Materials;2018-03-07

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