High energy x-ray photoelectron spectroscopy Cr Kα measurement of bulk gadolinium
Author:
Affiliation:
1. Imec, MCACSA 1 , Kapeldreef 75, 3001 Leuven, Belgium
2. Instituut voor Kern-en Stralingsfysica 2 , K.U. Leuven, Celestijnenlaan 200D, Leuven B-3001, Belgium
3. Physical Electronics 3 , 18725 Lake Drive East, Chanhassen, Minnesota 55317
Abstract
Publisher
American Vacuum Society
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Link
https://pubs.aip.org/avs/sss/article-pdf/doi/10.1116/6.0003116/18253904/024032_1_6.0003116.pdf
Reference4 articles.
1. See https://www.ulvac-phi.com/en/products/xps/quantes/ for a description of the Quantes spectrometer.
2. See https://www.kratos.com/products/axis-supra-xps-surface-analysis-instrument for a description of the AXIS Ultra spectrometer.
3. See https://scientaomicron.com/en/products-solutions/electron-spectroscopy/HAXPES-Lab for a description of the HAXPES-Lab spectrometer.
4. Reference survey spectra of elemental solid measured with Cr Kα photons as a tool for Quases analysis (5): Various elements (Mg, Sb, Bi, Se, Gd, Dy, Yb)
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1. Introduction to reproducible laboratory hard x-ray photoelectron spectroscopy;Journal of Vacuum Science & Technology A;2024-07-15
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