dc field-emission analysis of GaAs and plasma–source ion-implanted stainless steel-Reference-Cited by-同舟云学术

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dc field-emission analysis of GaAs and plasma–source ion-implanted stainless steel

Published:2003-07 Issue:4 Volume:21 Page:1115-1119
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Hernandez C.,Wang T.,Siggins T.,Bullard D.,Dylla H. F.,Reece C.,Theodore N. D.,Manos D. M.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.1577131

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nitrogen-Implanted Silicon Oxynitride: A Coating for Suppressing Field Emission From Stainless Steel Used in High-Voltage Applications;IEEE Transactions on Plasma Science;2006-08

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