Real‐time x‐ray topography: Applications to bulk HgCdTe materials-Reference-Cited by-同舟云学术

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Real‐time x‐ray topography: Applications to bulk HgCdTe materials

Published:1983-07 Issue:3 Volume:1 Page:1656-1660
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Rosemeier R. G.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.572250

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Impurities and Defects;Device Physics of Narrow Gap Semiconductors;2009-08-28

2. Topographic methods of studying defects in Hg1−xCdxTe crystals;Infrared Physics;1990-01

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