Thermal induced depletion of cationic vacancies in NiO thin films evidenced by x-ray absorption spectroscopy at the O 1s threshold-Reference-Cited by-同舟云学术

Thermal induced depletion of cationic vacancies in NiO thin films evidenced by x-ray absorption spectroscopy at the O 1s threshold

Published:2020-05 Issue:3 Volume:38 Page:033209
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A
language:en
Short-container-title:Journal of Vacuum Science & Technology A

Author:

Gutiérrez Alejandro¹^ORCID,Domínguez-Cañizares Guillermo¹,Krause Stefan²,Díaz-Fernández Daniel¹,Soriano Leonardo¹

Affiliation:

1. Departamento de Física Aplicada and Instituto de Ciencia de Materiales Nicolás Cabrera, Universidad Autónoma de Madrid, Cantoblanco, 28049 Madrid, Spain

2. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Straße 15, 12489 Berlin, Germany

Funder

Ministerio de Ciencia e Innovacion

Comunidad de Madrid

Seventh Framework Programme

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/6.0000080

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