Characteristics of polarity-controlled ZnO films fabricated using the homoepitaxy technique-Reference-Cited by-同舟云学术

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Characteristics of polarity-controlled ZnO films fabricated using the homoepitaxy technique

Published:2004 Issue:5 Volume:22 Page:2454
ISSN:0734-211X
Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
language:en
Short-container-title:J. Vac. Sci. Technol. B

Author:

Matsui Hiroaki,Saeki Hiromasa,Kawai Tomoji,Sasaki Atsushi,Yoshimoto Mamoru,Tsubaki Masato,Tabata Hitoshi

Publisher

American Vacuum Society

Subject

General Engineering

Cited by 56 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Atomic-scale growth, imaging, spectroscopy, and electronic transport properties of metal-oxide films and interfaces;Journal of Vacuum Science & Technology A;2022-01

2. Fabrication of ultra-flat c-axis oriented ZnO thin films on atomically stepped cyclo-olefin polymer (COP) substrates by pulsed laser deposition at RT;Japanese Journal of Applied Physics;2020-11-13

3. Changes in Schottky Barrier Height Behavior of Pt–Ru Alloy Contacts on Single-Crystal ZnO;NIMS Monographs;2020

4. Electronic Transport Properties Governed by Polarity Control through Tailoring of ZnO Bilayer Structures;Crystal Growth & Design;2018-08-28

5. Influence of crystallographic polarity on the opto-electrical properties of polycrystalline ZnO thin films deposited by magnetron sputtering;Applied Surface Science;2018-05

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