Effects of operational and geometrical conditions upon photosensitivity of amorphous InZnO thin film transistors-Reference-Cited by-同舟云学术

Effects of operational and geometrical conditions upon photosensitivity of amorphous InZnO thin film transistors

Published:2013-09 Issue:5 Volume:31 Page:050605
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
language:en
Short-container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

Author:

Park Sungho,Park Sekyoung,Ahn Seung-Eon,Song Ihun,Chae Wonseok,Han Manso,Lee Jeseung,Jeon Sanghun

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://avs.scitation.org/doi/pdf/10.1116/1.4818279

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