Study of interdiffusion between thin Y–Ba–Cu–O films and MgO substrates by applying Rutherford backscattering spectrometry combined with scanning tunneling microscopy
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Published:1999-09
Issue:5
Volume:17
Page:2962-2968
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ISSN:0734-2101
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Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
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language:en
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Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
Author:
Fujino Y.,Igarashi Y.,Yamaura S.,Suzuki N.,Iimura K.
Publisher
American Vacuum Society
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics