1. Notes and References;Principles of Electron Optics;2018
2. Notes and References for Volume 2;Principles of Electron Optics;1996
3. On the research of a post-lens deflector for a submicrometer lithography system;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1995-09
4. Notes and References;Principles of Electron Optics;1989
5. Calibrated deflection system for electron beam testing;Microelectronic Engineering;1987-01