Structure and optical characterization of ZnxCd1−xTe thin films prepared by the close spaced vapor transport method-Reference-Cited by-同舟云学术

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Structure and optical characterization of ZnxCd1−xTe thin films prepared by the close spaced vapor transport method

Published:1991-05 Issue:3 Volume:9 Page:550-553
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

González‐Hernández J.,Zelaya O.,Mendoza‐Alverez J. G.,López‐Cruz E.,Pawlik D. A.,Allred D. D.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.577407

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Energy Bandgap of Cd1−xZnxTe, Cd1−xZnxSe and Cd1−xZnxS Semiconductors: A First-Principles Analysis Based on Tran–Blaha–Modified Becke–Johnson Exchange Potential;Journal of Electronic Materials;2023-04-13

2. On determination of Cd1–xZnxTe composition from an analysis of the 4.2, 77 and 295 K edge photoluminescence spectra;Semiconductor Physics Quantum Electronics and Optoelectronics;2017-10-09

3. First principle optoelectronic studies of visible light sensitive CZT;Superlattices and Microstructures;2013-11

4. Surface morphology and depth profile study of Cd1−xZnxTe alloy nanostructures;Journal of Alloys and Compounds;2012-12

5. Growth and characterization of Cd1−xZnxTe thin films prepared from elemental multilayer deposition;Applied Surface Science;2010-06

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