Contrasting transparent conductive properties of ZnO films on amorphous and crystalline substrates in view of thickness dependence
Author:
Affiliation:
1. NTT Device Innovation Center, NTT Corporation, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
Publisher
American Vacuum Society
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Amorphous ZnO/PbS Quantum Dots Heterojunction for Efficient Responsivity Broadband Photodetectors;ACS Applied Materials & Interfaces;2020-01-23
2. Identification of defect species in ZnO thin films through process modification and monitoring of photoluminescent properties;Journal of Vacuum Science & Technology A;2019-12
3. Characteristics of Ga-doped ZnO thin-film ultraviolet photodetectors fabricated on patterned Si substrate;Semiconductor Science and Technology;2019-11-29
4. Atomic insights in crystallization of liquid Cu on single crystal Ta and amorphous Ta;Materials Research Express;2019-11-18
5. Photoluminescence studies of transparent conductive ZnO films to identify their donor species;AIP Advances;2019-04
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