Characterization of nitrogen‐containing glasses by x‐ray photoelectron spectroscopy-Reference-Cited by-同舟云学术

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Characterization of nitrogen‐containing glasses by x‐ray photoelectron spectroscopy

Published:1986-05 Issue:3 Volume:4 Page:1580-1584
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Clabes J. G.,Fern R. E.,Frischat G. H.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.573511

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Irradiation-induced changes in the local environment of Si and Al in LnSiAlON glasses as probed by 27Al and 29Si NMR;Journal of Non-Crystalline Solids;2007-03

2. Changes in irradiated LnSiAlO(N) glasses at a microscopic scale;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-06

3. Solubility of Gases in Glass Melts;Properties of Glass-Forming Melts;2005-05-12

4. Fracture and Subcritical Crack-Growth Behavior of Y-Si-Al-O-N Glasses and Si3N4 Ceramics;Journal of the American Ceramic Society;2004-12-21

5. XPS studies on oxynitride glasses in the system SiAlON;Journal of Non-Crystalline Solids;1997-07

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