In situ x-ray diffraction study of Ni–Yb interlayer and alloy systems on Si(100)-Reference-Cited by-同舟云学术

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In situ x-ray diffraction study of Ni–Yb interlayer and alloy systems on Si(100)

Published:2010-01 Issue:1 Volume:28 Page:20-26
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Knaepen W.,Demeulemeester J.,Jordan-Sweet J.,Vantomme A.,Detavernier C.,Van Meirhaeghe R. L.,Lavoie C.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.3259875

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. In situ study of the growth properties of Ni-rare earth silicides for interlayer and alloy systems on Si(100);Journal of Applied Physics;2012-02-15

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