Measurements of the secondary ion mass spectrometry isotope effect

Author:

Schwarz S. A.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Isotopic fractionation of sputtered anions: C− and;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-01

2. SIMS investigations of isotope effects at a processed solid surface;Vacuum;2006-09

3. Isotope effects in the formation of MCs+ molecular secondary ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-06

4. Isotopic fractionation of negative ions produced by Cs sputtering in a high-intensity source;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-07

5. Isotopic fractionation in the sputtering of 92Mo-100Mo targets;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-02

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