Electric field effects on force curves for oxidized silicon tips and ice surfaces in a controlled environment-Reference-Cited by-同舟云学术

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Electric field effects on force curves for oxidized silicon tips and ice surfaces in a controlled environment

Published:1996-05 Issue:3 Volume:14 Page:1213-1218
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Slaughterbeck C. R.,Kukes E. W.,Pittenger B.,Cook D. J.,Williams P. C.,Eden V. L.,Fain S. C.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.580269

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