Ex situ characterization of phase transformations and associated microstructures in polycrystalline thin films-Reference-Cited by-同舟云学术

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Ex situ characterization of phase transformations and associated microstructures in polycrystalline thin films

Published:1999-07 Issue:4 Volume:17 Page:1950-1957
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Barmak K.,Rickman J. M.,Michaelsen C.,Ristau R. A.,Kim J.,Lucadamo G. A.,Carpenter D. T.,Tong W. S.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.581709

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Interacting fronts in a prototypical, two-dimensional model of entropy-stabilized reactive phase formation;Journal of Applied Physics;2023-12-01

2. Deep learning analysis of defect and phase evolution during electron beam-induced transformations in WS2;npj Computational Materials;2019-02-01

3. Influence of layer microstructure on the double nucleation process in Cu∕Mg multilayers;Journal of Applied Physics;2006

4. On the relationship of magnetocrystalline anisotropy and stoichiometry in epitaxial L10 CoPt (001) and FePt (001) thin films;Journal of Applied Physics;2005-08

5. Calorimetric studies of the A1 to L10 transformation in binary FePt thin films with compositions in the range of 47.5–54.4at.% Fe;Journal of Applied Physics;2005-01-15

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