Characterization of multilayer diffusion barriers by electron probe microanalysis and Auger electron spectroscopy
Author:
Publisher
American Vacuum Society
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Link
http://avs.scitation.org/doi/pdf/10.1116/1.572679
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Electrochemical behavior and surface chemistry of non-equilibrium aluminum-tantalum alloys: Solute-rich interphase mechanisms;Surface and Interface Analysis;1995-08
2. Interdiffusion studies in silver/palladium couples by means of Auger depth profiling;Vacuum;1995-05
3. Chemical evaluation of Cu–polyimide interfaces;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1994-07
4. Interactions between (HgCd)Te and overlayers of intermediate reactivity (Ge, Ag, and Cu);Physical Review B;1988-11-15
5. The corrosion and passivity of aluminum exposed to dilute sodium sulfate solutions;Corrosion Science;1987-01
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