1. Modern Scanning Electron Microscopy. 1. Secondary Electron Emission;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2023-06
2. Effect of Contamination on a Test Object for SEM Calibration;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2020-11
3. Effect of the Focusing of a SEM Probe on the Formation of Relief Structure Images;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2020-05
4. Test Objects with a Rectangular Profile for SEM: 1. Fabrication Technology;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2019-11
5. Formation of SEM Images in the Secondary Electron Mode. 2. Structures with a Trapezoidal Profile and Small Side-Wall Inclinations;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2019-09