Accurate reflectometry for extreme-ultraviolet lithography at the National Institute of Standards and Technology
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Published:2002
Issue:6
Volume:20
Page:3080
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ISSN:0734-211X
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Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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language:en
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Short-container-title:J. Vac. Sci. Technol. B
Author:
Grantham S.,Tarrio C.,Lucatorto T. B.
Publisher
American Vacuum Society
Subject
General Engineering