Surface roughness analysis by scanning tunneling microscopy and atomic force microscopy-Reference-Cited by-同舟云学术

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Surface roughness analysis by scanning tunneling microscopy and atomic force microscopy

Published:1992-07 Issue:4 Volume:10 Page:2875-2879
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Files‐Sesler Leigh Ann,Hogan Tim,Taguchi Tomoaki

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.577723

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Air Oxidation of Self-Assembled Monolayers on Polycrystalline Gold: The Role of the Gold Substrate;Langmuir;1998-10-01

3. Algorithms for scanned probe microscope image simulation, surface reconstruction, and tip estimation;Journal of Research of the National Institute of Standards and Technology;1997-07

4. Morphological estimation of tip geometry for scanned probe microscopy;Surface Science;1994-12

5. The effect of growth parameters on the deposition of CaS thin films by atomic layer epitaxy;Applied Surface Science;1994-12

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