Pitfalls in the Interpretation of Structure-Sensitive Properties-Reference-Cited by-同舟云学术

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Pitfalls in the Interpretation of Structure-Sensitive Properties

Published:1969-07 Issue:4 Volume:6 Page:448-454
ISSN:0022-5355
Container-title:Journal of Vacuum Science and Technology
language:en
Short-container-title:Journal of Vacuum Science and Technology

Author:

Francombe M. H.

Publisher

American Vacuum Society

Subject

General Engineering

Link

http://avs.scitation.org/doi/pdf/10.1116/1.1315653

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Interdependence of the Electrical Properties and the Defect Structure in Heteroepitaxial Germanium and Silicon;Journal of Vacuum Science and Technology;1971-01

2. A bibliography of low energy electron diffraction and auger electron spectroscopy;Progress in Surface Science;1971-01

3. Interfacial energy as a factor in controlling epitaxial behavior;Surface Science;1970-09

4. Film Formation and Structure-Sensitive Properties—An Introduction;Journal of Vacuum Science and Technology;1969-07

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