Fabrication of thickness-controlled silicon nanowires and their characteristics-Reference-Cited by-同舟云学术

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Fabrication of thickness-controlled silicon nanowires and their characteristics

Published:1995-11 Issue:6 Volume:13 Page:2166
ISSN:0734-211X
Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
language:
Short-container-title:J. Vac. Sci. Technol. B

Author:

Namatsu Hideo

Publisher

American Vacuum Society

Subject

General Engineering

Cited by 36 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fundamentals of silicon nanotubes;Silicon Nanomaterials Sourcebook;2017-08-07

2. Electronic Structure of Single-Wall Silicon Nanotubes and Silicon Nanoribbons: Helical Symmetry Treatment and Effect of Dimensionality;Advances in Condensed Matter Physics;2013

3. One-Dimensional Inorganic Semiconductor Nanostructures;Mass Transport of Nanocarriers;2012-10-17

4. Silicon Nanowires: From Empirical to First Principles Modeling;Challenges and Advances in Computational Chemistry and Physics;2009-11-09

5. Semiconductor nanowire devices;Nano Today;2008-10

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