Determination and observation of electronic defect levels in CuInSe2 crystals and thin films-Reference-Cited by-同舟云学术

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Determination and observation of electronic defect levels in CuInSe2 crystals and thin films

Published:1991-05 Issue:3 Volume:9 Page:554-558
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Abou‐Elfotouh Fouad A.,Kazmerski L. L.,Moutinho H. R.,Wissel J. M.,Dhere R. G.,Nelson A. J.,Bakry A. M.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.577408

Cited by 31 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Defect distributions in Cu(In,Ga)(S,Se)2 solar cells with three different buffer layers;Current Applied Physics;2016-03

2. Evaluation of Back Contact in Spray Deposited SnS Thin Film Solar Cells by Impedance Analysis;ACS Applied Materials & Interfaces;2014-06-18

3. Application of impedance spectroscopy to investigate the electrical properties around the pn interface of Cu(In,Ga)Se2 solar cells;Thin Solid Films;2013-05

4. Effects of pulsed laser annealing on deep level defects in electrochemically-deposited and furnace annealed CuInSe2 thin films;Thin Solid Films;2013-03

5. Electronic Materials' Surfaces;Surfaces and Interfaces of Electronic Materials;2012-12-28

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