A study of Y–Ba–Cu–O/Si interfaces by x‐ray photoelectron spectroscopy-Reference-Cited by-同舟云学术

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A study of Y–Ba–Cu–O/Si interfaces by x‐ray photoelectron spectroscopy

Published:1992-01 Issue:1 Volume:10 Page:115-121
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Chourasia A. R.,Chopra D. R.,Bensaoula A. H.,Bensaoula A.,Ruzakowski P.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.578123

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An analysis of electron beam evaporation of SrTiO3on Si substrates;Journal of Physics: Condensed Matter;1994-08-01

2. Study of YBaCuO on W/Si by x‐ray photoelectron spectroscopy;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1992-07

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