Current oscillations in thin metal–oxide–semiconductor structures observed by ballistic electron emission microscopy-Reference-Cited by-同舟云学术

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Current oscillations in thin metal–oxide–semiconductor structures observed by ballistic electron emission microscopy

Published:1998-07 Issue:4 Volume:16 Page:2296
ISSN:0734-211X
Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
language:
Short-container-title:J. Vac. Sci. Technol. B

Author:

Wen H. J.

Publisher

American Vacuum Society

Subject

General Engineering

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. Vibrational excitations in molecular layers probed by ballistic electron microscopy;Nanotechnology;2011-09-29

4. Electron interferometry in the proximity of amorphous ultrathin SiO2∕Si;Applied Physics Letters;2007-04-30

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