Work function measurement by ultraviolet photoelectron spectroscopy: Versailles project on advanced materials and standards interlaboratory study

Author:

Kim Jeong Won12ORCID,Kim Ansoon12ORCID,Hwang Hui Ung12ORCID,Kim Jun Hyung12,Choi Seungwook12ORCID,Koch Norbert3ORCID,Shin Dongguen3ORCID,Zhao Zhijuan4ORCID,Liu Fen4,Choi Minki5,Lee Kyu Myung6ORCID,Park Yongsup67ORCID

Affiliation:

1. Korean Research Institute of Standards and Science (KRISS) 1 , 267 Gajeong-ro, Daejeon 34113, South Korea

2. Korean University of Science and Technology (UST) 2 , 217 Gajeong-ro, Daejeon 34113, South Korea

3. Institut für Physik, Humboldt-Universität zu Berlin 3 , Brook-Taylor-Strasse 6, Berlin 12489, Germany

4. Institute of Chemistry, Chinese Academy of Sciences (CAS) 4 , 2 North 1st Street, Zhongguancun, Beijing 100190, People's Republic of China

5. SK Hynix 5 , 2091 Gyeongchung-daero, Icheon-si, Gyeonggi-do 17336, South Korea

6. Department of Physics, Kyung Hee University 6 , 26, Kyungheedae-ro, Dongdaemun-gu, Seoul 02447, South Korea

7. Department of Information Display 7 , , Kyung Hee University, Seoul 02447, South Korea

Abstract

We present the results of an interlaboratory study on work function (WF) measurements by ultraviolet photoelectron spectroscopy (UPS) conducted under the auspices of the Versailles Project on Advanced Materials and Standards. Two samples, gold (Au) film deposited on a flat Si(100) and highly oriented pyrolytic graphite (HOPG), were distributed to six different laboratories. Prior to UPS measurements, the samples underwent common sample pre-cleaning procedures: wet treatment and Ar+-sputtering in a vacuum for Au, and mechanical peeling in air for HOPG. Instrumental settings are adjusted for energy-scale calibration and sample bias optimization. The average reference WF value (WFref) and its expanded uncertainty (Uref) were calculated from each dataset that participants provided. The results of the Au sample demonstrated 5.40 ± 0.13 eV after Ar+ sputtering in vacuum, while the HOPG sample showed 4.62 ± 0.16 eV after mechanical peeling-off. Even though the participants used slightly different sample bias voltages and sample cleaning methods with various instruments, the results demonstrate remarkable consistency. Their consistency among the laboratories for both samples with high and low WF values provides a basis for establishing a new international standard for UPS in the surface chemical analysis community.

Funder

National Research Foundation of Korea

Multidimensional Materials Research Center (MMRC) at Kyung Hee University

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3