Yttrium aluminum garnet analyzed by x-ray photoelectron spectroscopy

Abstract

Yttrium aluminum garnet (YAG) is a composite crystalline material used as a substrate in various optical applications, especially high-power lasers. It is currently doped with different elements depending on the desired application. This has generated small controversies depending on the fabrication method as well as the doping content. In the present work, a high-purity YAG single crystal was characterized using x-ray photoelectron spectroscopy (XPS) technique. Exploratory spectra, high-resolution spectra for C 1s, O 1s, Y 3d, and Al 2p, and valence band (VB) spectra were acquired. The results showed the presence of yttrium and aluminum oxides with the characteristic stoichiometry of YAG. In addition, the presence of adventitious carbon was detected, without the presence of impurities.