ToF-SIMS and other surface spectroscopies applied to the study of ancient artifacts: Preliminary investigation of a tetradrachm of Claudius-Reference-Cited by-同舟云学术

ToF-SIMS and other surface spectroscopies applied to the study of ancient artifacts: Preliminary investigation of a tetradrachm of Claudius

Published:2018-05 Issue:3 Volume:36 Page:03F104
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
language:en
Short-container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

Author:

Sodhi Rana N. S.¹,Brodersen Peter¹,Boccia Sal¹,Anastassiades Amandina²,Zaccagnino Cristiana³

Affiliation:

1. Department of Chemical Engineering and Applied Chemistry, Ontario Centre for the Characterisation of Advanced Materials, University of Toronto, Toronto, Ontario M5S 3E5, Canada

2. Department of Art History and Art Conservation, Queen's University, Kingston, Ontario K7L 3N6, Canada

3. Classics/Languages, Literatures and Cultures, Queen's University, Kingston, Ontario K7L 3N6, Canada

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://avs.scitation.org/doi/pdf/10.1116/1.5013613

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1. Corrosion mechanisms in copper-based artifacts investigated by secondary ion mass spectrometry;Encyclopedia of Solid-Liquid Interfaces;2024

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3. XPS and TOF‐SIMS applied to the study of ancient artifacts: Further studies on Alexandrian tetradrachms from the time of the Julio‐Claudian dynasty;Surface and Interface Analysis;2020-06-16

4. Atomic spectrometry update: review of advances in the analysis of metals, chemicals and materials;Journal of Analytical Atomic Spectrometry;2019