Characteristics of Nb-based tunnel junctions fabricated by selective trilayer ion-beam etching process
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Published:1987-11
Issue:6
Volume:5
Page:1569
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ISSN:0734-211X
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Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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language:
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Short-container-title:J. Vac. Sci. Technol. B
Publisher
American Vacuum Society
Subject
General Engineering