Multivariate statistical analysis for x-ray photoelectron spectroscopy spectral imaging: Effect of image acquisition time-Reference-Cited by-同舟云学术

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Multivariate statistical analysis for x-ray photoelectron spectroscopy spectral imaging: Effect of image acquisition time

Published:2004-07 Issue:4 Volume:22 Page:1579-1586
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Peebles D. E.,Ohlhausen J. A.,Kotula P. G.,Hutton S.,Blomfield C.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.1765134

Cited by 21 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Chemical characterization of plasma-activated polymeric surfaces via XPS analyses: A review;Surfaces and Interfaces;2022-07

2. Including noise characteristics in MCR to improve mapping and component extraction from spectral images;Chemometrics and Intelligent Laboratory Systems;2016-04

3. Application of XPS imaging analysis in understanding interfacial delamination and X-ray radiation degradation of PMMA;Surface and Interface Analysis;2013-10-18

4. Multivariate factor analysis of heavy minerals concentrate from Athabasca oil sands tailings by X-ray photoelectron spectroscopy;Surface and Interface Analysis;2013-02-03

5. Multivariate Statistics Applications in Scanning Transmission Electron Microscopy X-Ray Spectrum Imaging;Advances in Imaging and Electron Physics;2011

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