Measurement of complete Auger electron emission angular distributions from β‐SiC films on Si(100)-Reference-Cited by-同舟云学术

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Measurement of complete Auger electron emission angular distributions from β‐SiC films on Si(100)

Published:1994-03 Issue:2 Volume:12 Page:457-464
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Chyan Oliver M. R.,Frank Douglas G.,Hubbard Arthur T.,Li J. P.,Steckl Andrew J.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.579263

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Splitting effects in high resolution and high energy photoelectron diffraction: the case of MgO(001);Surface Science;1995-12

2. Strong element dependence of C 1s and Si 2p X-ray photoelectron diffraction profiles for identical C and Si local geometries in β-SiC;Surface Science;1995-10

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